Daily Papers

Surface defect detection is a critical task across numerous industries, aimed at efficiently identifying and localising imperfections or irregularities on manufactured components. While numerous methods have been proposed, many fail to meet industrial demands for high performance, efficiency, and adaptability. Existing approaches are often constrained to specific supervision scenarios and struggle to adapt to the diverse data annotations encountered in real-world manufacturing processes, such as unsupervised, weakly supervised, mixed supervision, and fully supervised settings. To address these challenges, we propose SuperSimpleNet, a highly efficient and adaptable discriminative model built on the foundation of SimpleNet. SuperSimpleNet incorporates a novel synthetic anomaly generation process, an enhanced classification head, and an improved learning procedure, enabling efficient training in all four supervision scenarios, making it the first model capable of fully leveraging all available data annotations. SuperSimpleNet sets a new standard for performance across all scenarios, as demonstrated by its results on four challenging benchmark datasets. Beyond accuracy, it is very fast, achieving an inference time below 10 ms. With its ability to unify diverse supervision paradigms while maintaining outstanding speed and reliability, SuperSimpleNet represents a promising step forward in addressing real-world manufacturing challenges and bridging the gap between academic research and industrial applications. Code: https://github.com/blaz-r/SuperSimpleNet

The aim of surface defect detection is to identify and localise abnormal regions on the surfaces of captured objects, a task that's increasingly demanded across various industries. Current approaches frequently fail to fulfil the extensive demands of these industries, which encompass high performance, consistency, and fast operation, along with the capacity to leverage the entirety of the available training data. Addressing these gaps, we introduce SuperSimpleNet, an innovative discriminative model that evolved from SimpleNet. This advanced model significantly enhances its predecessor's training consistency, inference time, as well as detection performance. SuperSimpleNet operates in an unsupervised manner using only normal training images but also benefits from labelled abnormal training images when they are available. SuperSimpleNet achieves state-of-the-art results in both the supervised and the unsupervised settings, as demonstrated by experiments across four challenging benchmark datasets. Code: https://github.com/blaz-r/SuperSimpleNet .

Visual surface anomaly detection aims to detect local image regions that significantly deviate from normal appearance. Recent surface anomaly detection methods rely on generative models to accurately reconstruct the normal areas and to fail on anomalies. These methods are trained only on anomaly-free images, and often require hand-crafted post-processing steps to localize the anomalies, which prohibits optimizing the feature extraction for maximal detection capability. In addition to reconstructive approach, we cast surface anomaly detection primarily as a discriminative problem and propose a discriminatively trained reconstruction anomaly embedding model (DRAEM). The proposed method learns a joint representation of an anomalous image and its anomaly-free reconstruction, while simultaneously learning a decision boundary between normal and anomalous examples. The method enables direct anomaly localization without the need for additional complicated post-processing of the network output and can be trained using simple and general anomaly simulations. On the challenging MVTec anomaly detection dataset, DRAEM outperforms the current state-of-the-art unsupervised methods by a large margin and even delivers detection performance close to the fully-supervised methods on the widely used DAGM surface-defect detection dataset, while substantially outperforming them in localization accuracy.

Surface defects are a primary source of yield loss in manufacturing, yet existing anomaly detection methods often fail in real-world deployment due to limited and unrepresentative datasets. To overcome this, we introduce 3D-ADAM, a 3D Anomaly Detection in Additive Manufacturing dataset, that is the first large-scale, industry-relevant dataset for RGB+3D surface defect detection in additive manufacturing. 3D-ADAM comprises 14,120 high-resolution scans of 217 unique parts, captured with four industrial depth sensors, and includes 27,346 annotated defects across 12 categories along with 27,346 annotations of machine element features in 16 classes. 3D-ADAM is captured in a real industrial environment and as such reflects real production conditions, including variations in part placement, sensor positioning, lighting, and partial occlusion. Benchmarking state-of-the-art models demonstrates that 3D-ADAM presents substantial challenges beyond existing datasets. Validation through expert labelling surveys with industry partners further confirms its industrial relevance. By providing this benchmark, 3D-ADAM establishes a foundation for advancing robust 3D anomaly detection capable of meeting manufacturing demands.

The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted directly onto the surface of a Printed Circuit Board (PCB). Although the expansion of electronic devices affects our lives in a productive way, failures or defects in the manufacturing procedure of those devices might also be counterproductive and even harmful in some cases. It is therefore desired and sometimes crucial to ensure zero-defect quality in electronic devices and their production. While traditional Image Processing (IP) techniques are not sufficient to produce a complete solution, other promising methods like Deep Learning (DL) might also be challenging for PCB inspection, mainly because such methods require big adequate datasets which are missing, not available or not updated in the rapidly growing field of PCBs. Thus, PCB inspection is conventionally performed manually by human experts. Unsupervised Learning (UL) methods may potentially be suitable for PCB inspection, having learning capabilities on the one hand, while not relying on large datasets on the other. In this paper, we introduce ChangeChip, an automated and integrated change detection system for defect detection in PCBs, from soldering defects to missing or misaligned electronic elements, based on Computer Vision (CV) and UL. We achieve good quality defect detection by applying an unsupervised change detection between images of a golden PCB (reference) and the inspected PCB under various setting. In this work, we also present CD-PCB, a synthesized labeled dataset of 20 pairs of PCB images for evaluation of defect detection algorithms.

Detecting surface anomalies of industrial materials poses a significant challenge within a myriad of industrial manufacturing processes. In recent times, various methodologies have emerged, capitalizing on the advantages of employing a network pre-trained on natural images for the extraction of representative features. Subsequently, these features are subjected to processing through a diverse range of techniques including memory banks, normalizing flow, and knowledge distillation, which have exhibited exceptional accuracy. This paper revisits approaches based on pre-trained features by introducing a novel method centered on target-specific embedding. To capture the most representative features of the texture under consideration, we employ a variant of a contrastive training procedure that incorporates both artificially generated defective samples and anomaly-free samples during training. Exploiting the intrinsic properties of surfaces, we derived a meaningful representation from the defect-free samples during training, facilitating a straightforward yet effective calculation of anomaly scores. The experiments conducted on the MVTEC AD and TILDA datasets demonstrate the competitiveness of our approach compared to state-of-the-art methods.

Detecting small objects in UAV remote sensing images and identifying surface defects in industrial inspection remain difficult tasks. These applications face common obstacles: features are sparse and weak, backgrounds are cluttered, and object scales vary dramatically. Current transformer-based detectors, while powerful, struggle with three critical issues. First, features degrade severely as networks downsample progressively. Second, spatial convolutions cannot capture long-range dependencies effectively. Third, standard upsampling methods inflate feature maps unnecessarily. We introduce DFIR-DETR to tackle these problems through dynamic feature aggregation combined with frequency-domain processing. Our architecture builds on three novel components. The DCFA module uses dynamic K-sparse attention, cutting complexity from O(N2) down to O(NK), and employs spatial gated linear units for better nonlinear modeling. The DFPN module applies amplitude-normalized upsampling to prevent feature inflation and uses dual-path shuffle convolution to retain spatial details across scales. The FIRC3 module operates in the frequency domain, achieving global receptive fields without sacrificing efficiency. We tested our method extensively on NEU-DET and VisDrone datasets. Results show mAP50 scores of 92.9% and 51.6% respectively-both state-of-the-art. The model stays lightweight with just 11.7M parameters and 41.2 GFLOPs. Strong performance across two very different domains confirms that DFIR-DETR generalizes well and works effectively in resource-limited settings for cross-scene small object detection.

In industrial anomaly detection (IAD), accurately identifying defects amidst diverse anomalies and under varying imaging conditions remains a significant challenge. Traditional approaches often struggle with high false-positive rates, frequently misclassifying normal shadows and surface deformations as defects, an issue that becomes particularly pronounced in products with complex and intricate surface features. To address these challenges, we introduce PA-CLIP, a zero-shot anomaly detection method that reduces background noise and enhances defect detection through a pseudo-anomaly-based framework. The proposed method integrates a multiscale feature aggregation strategy for capturing detailed global and local information, two memory banks for distinguishing background information, including normal patterns and pseudo-anomalies, from true anomaly features, and a decision-making module designed to minimize false positives caused by environmental variations while maintaining high defect sensitivity. Demonstrated on the MVTec AD and VisA datasets, PA-CLIP outperforms existing zero-shot methods, providing a robust solution for industrial defect detection.

The capability to detect boulders on the surface of small bodies is beneficial for vision-based applications such as hazard detection during critical operations and navigation. This task is challenging due to the wide assortment of irregular shapes, the characteristics of the boulders population, and the rapid variability in the illumination conditions. Moreover, the lack of publicly available labeled datasets for these applications damps the research about data-driven algorithms. In this work, the authors provide a statistical characterization and setup used for the generation of two datasets about boulders on small bodies that are made publicly available.

In this technical report, we present our solution to the CVPR 2025 Visual Anomaly and Novelty Detection (VAND) 3.0 Workshop Challenge Track 1: Adapt & Detect: Robust Anomaly Detection in Real-World Applications. In real-world industrial anomaly detection, it is crucial to accurately identify anomalies with physical complexity, such as transparent or reflective surfaces, occlusions, and low-contrast contaminations. The recently proposed MVTec AD 2 dataset significantly narrows the gap between publicly available benchmarks and anomalies found in real-world industrial environments. To address the challenges posed by this dataset--such as complex and varying lighting conditions and real anomalies with large scale differences--we propose a fully training-free anomaly detection and segmentation method based on feature extraction using the DINOv2 model named SuperAD. Our method carefully selects a small number of normal reference images and constructs a memory bank by leveraging the strong representational power of DINOv2. Anomalies are then segmented by performing nearest neighbor matching between test image features and the memory bank. Our method achieves competitive results on both test sets of the MVTec AD 2 dataset.

Recently, vision-language models (e.g. CLIP) have demonstrated remarkable performance in zero-shot anomaly detection (ZSAD). By leveraging auxiliary data during training, these models can directly perform cross-category anomaly detection on target datasets, such as detecting defects on industrial product surfaces or identifying tumors in organ tissues. Existing approaches typically construct text prompts through either manual design or the optimization of learnable prompt vectors. However, these methods face several challenges: 1) handcrafted prompts require extensive expert knowledge and trial-and-error; 2) single-form learnable prompts struggle to capture complex anomaly semantics; and 3) an unconstrained prompt space limits generalization to unseen categories. To address these issues, we propose Bayesian Prompt Flow Learning (Bayes-PFL), which models the prompt space as a learnable probability distribution from a Bayesian perspective. Specifically, a prompt flow module is designed to learn both image-specific and image-agnostic distributions, which are jointly utilized to regularize the text prompt space and improve the model's generalization on unseen categories. These learned distributions are then sampled to generate diverse text prompts, effectively covering the prompt space. Additionally, a residual cross-model attention (RCA) module is introduced to better align dynamic text embeddings with fine-grained image features. Extensive experiments on 15 industrial and medical datasets demonstrate our method's superior performance. The code is available at https://github.com/xiaozhen228/Bayes-PFL.